Press release
FOR IMMEDIATE RELEASE
Contact information:
Ellisys Corporation
Chuck Trefts, Director of Marketing
Phone: (866) 724-9185
Email: chuck.trefts@ellisys.com
Web site: www.ellisys.com
Ellisys Announces Collaborations with Major Test & Measurement Companies
Strategic Relationships with Tektronix and Agilent Technologies Focus
on Silicon Testing for SuperSpeed USB 3.0
Geneva, Switzerland — July 6, 2009 — Ellisys, a leading supplier
of protocol test and analysis solutions for USB 3.0 (SuperSpeed USB), the Universal
Serial Bus (USB), Wireless USB, the WiMedia UWB platform, and Bluetooth®,
today announced collaborations with leading test & measurement providers
Agilent Technologies and Tektronix, Inc. Ellisys will work with Agilent
and Tektronix to extend their respective physical layer test and compliance
solutions for SuperSpeed USB, including loopback mode receiver testing. These
additional capabilities will be provided by special-purpose configurations
of the Ellisys Explorer 280 (EX280) SuperSpeed USB 3.0 protocol analyzer/generator
system. SuperSpeed USB, employing a 5Gb/second signaling rate, is the
latest version of the ubiquitous USB personal interconnect, targeted at applications
involving rich media, storage, and large digital transfers.
“These
collaborations with Tektronix and Agilent bring together our SuperSpeed USB
protocol test and analysis capabilities with high-performance, world-class
physical layer test and measurement tools to meet receiver testing and other
specific physical layer test requirements of silicon manufacturers currently
working to bring SuperSpeed USB to the technology marketplace,” states
Mario Pasquali, Ellisys co-founder and president for products. “We’re
pleased to be working closely with these industry-leading companies to bring
valuable vertical solutions to SuperSpeed USB developers.”
“Having advance access to measurements enables developers of cutting-edge
digital devices to address potential design issues early in the design cycle
and get products to market faster,” said Jim Choate, program manager USB
applications at Agilent. “We are looking forward to working closely with
Ellisys to further address the upcoming USB protocol analysis challenges with
our continuously growing portfolio of USB 2.0 and 3.0 test solutions.“
“Tektronix is pleased to be working with Ellisys to help engineers solve
USB design verification and compliance challenges faster,” said Ian Valentine,
general manager, Technology Solutions Group, Tektronix. “Our extensive
PHY layer debugging and automated compliance toolsets are
the perfect complement to the outstanding Ellisys protocol support for SuperSpeed
USB.”
Receiver Test Mode Defined by SuperSpeed USB Specification
These strategic relationships pave the way for various test methodologies and
applications. A primary application involves SuperSpeed USB receiver testing. The
USB 3.0 specification defines an internal mechanism that characterizes the error
rate of a SuperSpeed USB receiver, as well as a special compliance test mode
that allows a receiver to loop back bit streams it receives to its transmitter
for retransmission to other test equipment for characterization. To extend
test capabilities, Ellisys will provide versions of its SuperSpeed USB Explorer
280 for purposes of characterizing the bit error rate (BER) in the retransmitted
bit streams. Test equipment provided by Tektronix or Agilent can be used
to precisely control a multitude of complex physical parameters of the signal
transmitted to the receiver in order to test various aspects of the receiver’s
capabilities, which are then characterized by the Ellisys EX280 system.
SuperSpeed Provides Major Performance Boost
SuperSpeed USB is the latest version of the USB personal interconnect, originally
introduced in 1995. SuperSpeed USB will deliver a 10x performance increase
as compared to USB 2.0 devices, and will remain backward-compatible to USB 2.0. The
growing ubiquity of large digital media files, high-definition video, flash drives,
camcorders, external hard drives, and many other data-intense applications and
devices will drive the consumer need for the increased performance provided by
this new technology. Consumers should expect the availability of SuperSpeed
USB-enabled computer platforms and devices in early 2010.
Additional Information
Additional information can be found at: www.ellisys.com/products/usbex280 or
by contacting Ellisys at info@ellisys.com.
About Ellisys
Ellisys is a test and measurement company committed to the design and timely
introduction of advanced protocol analysis solutions for USB, SuperSpeed USB
3.0, Wireless USB, WiMedia Ultra-Wideband, and Bluetooth technology. Developers
have been using Ellisys products and solutions for more than eight years with
great success. By providing technology developers with the right innovative
tools at the right time, Ellisys enables these promising markets to grow in a
secure and confident manner, helping to ensure rapid and wide acceptance of these
technologies.
Ellisys ● chemin du Grand-Puits 38 ● CH-1217
Meyrin Geneva ● Switzerland
World Class Protocol Test Solutions for USB, Wireless USB, WiMedia, Bluetooth
technology
The Bluetooth word mark and logo are registered trademarks
and are owned by the Bluetooth SIG, Inc.
Ellisys, the Ellisys logo, Better Analysis, USB Explorer, USB Tracker,
WiMedia Explorer, and Bluetooth Explorer are trademarks of Ellisys, and may
be registered in some jurisdictions. All other trademarks, product and company
names, are the property of their respective owners.
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